Computed tomography: a powerful imaging technique in the fields of dimensional metrology and quality control

Gabriel Probst; Bart Boeckmans; Wim Dewulf; Jean-Pierre Kruth

doi:10.1117/12.2227146

19 May 2016 Computed tomography: a powerful imaging technique in the fields of dimensional metrology and quality control

Gabriel Probst, Bart Boeckmans, Wim Dewulf, Jean-Pierre Kruth

Author Affiliations +

Proceedings Volume 9868, Dimensional Optical Metrology and Inspection for Practical Applications V; 98680G (2016) https://doi.org/10.1117/12.2227146
Event: SPIE Commercial + Scientific Sensing and Imaging, 2016, Baltimore, MD, United States

Abstract

X-ray computed tomography (CT) is slowly conquering its space in the manufacturing industry for dimensional metrology and quality control purposes. The main advantage is its non-invasive and non-destructive character. Currently, CT is the only measurement technique that allows full 3D visualization of both inner and outer features of an object through a contactless probing system. Using hundreds of radiographs, acquired while rotating the object, a 3D representation is generated and dimensions can be verified. In this research, this non-contact technique was used for the inspection of assembled components. A dental cast model with 8 implants, connected by a screwed retained bar made of titanium. The retained bar includes a mating interface connection that should ensure a perfect fitting without residual stresses when the connection is fixed with screws. CT was used to inspect the mating interfaces between these two components. Gaps at the connections can lead to bacterial growth and potential inconvenience for the patient who would have to face a new surgery to replace his/hers prosthesis. With the aid of CT, flaws in the design or manufacturing process that could lead to gaps at the connections could be assessed.

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Gabriel Probst, Bart Boeckmans, Wim Dewulf, and Jean-Pierre Kruth "Computed tomography: a powerful imaging technique in the fields of dimensional metrology and quality control", Proc. SPIE 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 98680G (19 May 2016); https://doi.org/10.1117/12.2227146

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