Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors

Luisa Sciortino; Ugo Lo Cicero; Elena Magnano; Igor Píš; Marco Barbera

doi:10.1117/12.2232376

18 July 2016 Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors

Luisa Sciortino, Ugo Lo Cicero, Elena Magnano, Igor Píš, Marco Barbera

Proceedings Volume 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray; 990566 (2016) https://doi.org/10.1117/12.2232376
Event: SPIE Astronomical Telescopes + Instrumentation, 2016, Edinburgh, United Kingdom

Abstract

The ATHENA mission provides the demanded capabilities to address the ESA science theme "Hot and Energetic Universe". Two complementary instruments are foreseen: the X-IFU (X-ray Integral Field Unit) and WFI (Wide Field Imager). Both the instruments require filters to avoid that the IR radiation heats the X-IFU cryogenic detector and to protect the WFI detector from UV photons. Previous experience on XMM filters recommends to employ bilayer membrane consisting of aluminum deposited on polyimide. In this work, we use the X-ray Photoelectron Spectroscopy (XPS) to quantify the native aluminum oxide thickness that affects the spectral properties of the filter. The estimation of the oxide thickness of the prototype filter for ATHENA is a considerable information for the conceptual design of the filters.

Citation Download Citation

Luisa Sciortino, Ugo Lo Cicero, Elena Magnano, Igor Píš, and Marco Barbera "Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors", Proc. SPIE 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, 990566 (18 July 2016); https://doi.org/10.1117/12.2232376

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