Ray-tracing as a tool for efficient specification of beamline optical components

P. Pedreira; I. Sics; M. Llonch; J. Ladrera; Ll. Ribó; C. Colldelram; J. Nicolas

doi:10.1117/12.2237599

8 September 2016 Ray-tracing as a tool for efficient specification of beamline optical components

P. Pedreira, I. Sics, M. Llonch, J. Ladrera, Ll. Ribó, C. Colldelram, J. Nicolas

Proceedings Volume 9962, Advances in Metrology for X-Ray and EUV Optics VI; 99620H (2016) https://doi.org/10.1117/12.2237599
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

We propose a method to determine the required performances of the positioning mechanics of the optical elements of a beamline. Generally, when designing and specifying a beamline, one assumes that the position and orientations of the optical elements should be aligned to its ideal position. For this, one would generally require six degrees of freedom per optical element. However, this number is reduced due to symmetries (e.g. a flat mirror does not care about yaw). Generally, one ends up by motorizing many axes, with high resolution and a large motion range. On the other hand, the diagnostics available at a beamline provide much less variables than the available motions. Moreover, the actual parameters that one wants to optimize are reduced to a very few. These are basically, spot size and size at the sample, flux, and spectral resolution. The result is that many configurations of the beamline are actually equivalent, and therefore indistinguishable from the ideal alignment in terms of performance.We propose a method in which the effect of misalignment of each one of the degrees of freedom of the beamline is scanned by ray tracing. This allows building a linear system in which one can identify and select the best set of motions to control the relevant parameters of the beam. Once the model is built it provides the required optical pseudomotors as well as the requirements in alignment and manufacturing, for all the motions, as well as the range, resolution and repeatability of the motorized axes.

Conference Presentation

Citation Download Citation

P. Pedreira, I. Sics, M. Llonch, J. Ladrera, Ll. Ribó, C. Colldelram, and J. Nicolas "Ray-tracing as a tool for efficient specification of beamline optical components", Proc. SPIE 9962, Advances in Metrology for X-Ray and EUV Optics VI, 99620H (8 September 2016); https://doi.org/10.1117/12.2237599

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