POC in the process of acquiring polarization characteristics

Xiaojun Zhou; Ercong Cao; Guohua Gu; Weixian Qian; Wei Yang; Haiyue Zhang

doi:10.1117/12.2235747

12 September 2016 POC in the process of acquiring polarization characteristics

Xiaojun Zhou, Ercong Cao, Guohua Gu, Weixian Qian, Wei Yang, Haiyue Zhang

Proceedings Volume 9970, Optics and Photonics for Information Processing X; 997014 (2016) https://doi.org/10.1117/12.2235747
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

Considering the change of optical information on material surface, this paper proposes a useful notion called pixel-level optical constants (POC). Through Fresnel equations, traditional optical constants (refractive index n and extinction coefficient k ) can reflect photoelectric characteristics on material surface. Combining with Mueller calculus in polarization optics, POC can describe the distrbution of photoelectric characteristics on material surface. POC is mainly calculated by the decomposition of Mueller matrix which includes Fresnel amplitude, ratio of two orthogonal reflection coefficient component P and variation of phase difference between incident light and reflected light Δ . With the regularity of polarized light and the statistics of Mueller matrices, optical characteristics can be detailed to each pixel in POC, which will independently show the distribution of polarization characteristics on material surface. And it can also be approximately averaged to obtain traditional optical constants. So POC is significant to optical researches on material surface.

Citation Download Citation

Xiaojun Zhou, Ercong Cao, Guohua Gu, Weixian Qian, Wei Yang, and Haiyue Zhang "POC in the process of acquiring polarization characteristics", Proc. SPIE 9970, Optics and Photonics for Information Processing X, 997014 (12 September 2016); https://doi.org/10.1117/12.2235747

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