Simulation of an IXS imaging analyzer with an extended scattering source

Alexey Suvorov; Yong Q. Cai

doi:10.1117/12.2237868

15 September 2016 Simulation of an IXS imaging analyzer with an extended scattering source

Alexey Suvorov, Yong Q. Cai

Proceedings Volume 9963, Advances in X-Ray/EUV Optics and Components XI; 99630A (2016) https://doi.org/10.1117/12.2237868
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

A concept of an inelastic x-ray scattering (IXS) spectrograph with an imaging analyzer was proposed recently and discussed in a number of publications (see e.g. Ref.1). The imaging analyzer as proposed combines x-ray lenses with highly dispersive crystal optics. It allows conversion of the x-ray energy spectrum into a spatial image with very high energy resolution. However, the presented theoretical analysis of the spectrograph did not take into account details of the scattered radiation source, i.e. sample, and its impact on the spectrograph performance. Using numerical simulations we investigated the influence of the finite sample thickness, the scattering angle and the incident energy detuning on the analyzer image and the ultimate resolution.

Conference Presentation

Citation Download Citation

Alexey Suvorov and Yong Q. Cai "Simulation of an IXS imaging analyzer with an extended scattering source", Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 99630A (15 September 2016); https://doi.org/10.1117/12.2237868

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