Presentation + Paper
16 September 2016 High-resolution radiography of thick steel objects using an all-laser-driven MeV-energy x-ray source
Daniel Haden, Shouyuan Chen, Baozhen Zhao, Ping Zhang, Grigory Golovin, Wenchao Yan, Colton Fruhling, Sudeep Banerjee, Donald Umstadter
Author Affiliations +
Abstract
The recent development of a high-brightness MeV-photon source based on inverse-Compton scattering (ICS) has opened up exciting new possibilities for high-resolution radiography of dense objects. The x-ray beam is extremely bright, micron-source size, with mrad divergence, and high-spectral density, which makes it ideal for studies where high-resolution is required. The x-ray source is tunable over a wide range of parameters and we will discuss how the adjustable source parameters affect both transverse and longitudinal resolution. We then present results on the radiography of a thick steel object using this ICS source, and demonstrate the capabilities of this source with respect to operation at high photon energy while providing high spatial resolution.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel Haden, Shouyuan Chen, Baozhen Zhao, Ping Zhang, Grigory Golovin, Wenchao Yan, Colton Fruhling, Sudeep Banerjee, and Donald Umstadter "High-resolution radiography of thick steel objects using an all-laser-driven MeV-energy x-ray source", Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 99640G (16 September 2016); https://doi.org/10.1117/12.2241606
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KEYWORDS
Laser scattering

X-rays

Scattering

Radiography

Signal to noise ratio

X-ray sources

Sensors

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