Refractive index measurements of Ge

John H. Burnett; Simon G. Kaplan; Eric Stover; Adam Phenis

doi:10.1117/12.2237978

20 September 2016 Refractive index measurements of Ge

John H. Burnett, Simon G. Kaplan, Eric Stover, Adam Phenis

Proceedings Volume 9974, Infrared Sensors, Devices, and Applications VI; 99740X (2016) https://doi.org/10.1117/12.2237978
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

A program has been started at NIST to make high-accuracy measurements of the infrared (IR) index properties of technologically important IR materials, in order to provide the IR optics community with updated values for the highest quality materials now available. For this purpose, we designed and built a minimum-deviation-angle refractometry system enabling diffraction-limited index measurements for wavelengths from 0.12 μm to 14 μm. We discuss the apparatus and procedures that we use for IR measurements. First results are presented for germanium for the wavelength range from 2 μm to 14 μm, with standard uncertainties ranging from 2 × 10^-5 near 2 μm to 8 × 10^-5 near 14 μm. This is an improvement by about an order of magnitude of the uncertainty level for index data of germanium generally used for optic design. A Sellmeier formula fitting our data for this range is provided. An analysis of the uncertainty is presented in detail. These measurements are compared to previous measurements of Ge.

Conference Presentation

Citation Download Citation

John H. Burnett, Simon G. Kaplan, Eric Stover, and Adam Phenis "Refractive index measurements of Ge", Proc. SPIE 9974, Infrared Sensors, Devices, and Applications VI, 99740X (20 September 2016); https://doi.org/10.1117/12.2237978

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