A spectral measurement method for determining white OLED average junction temperatures

Yiting Zhu; Nadarajah Narendran

doi:10.1117/12.2240424

22 September 2016 A spectral measurement method for determining white OLED average junction temperatures

Yiting Zhu, Nadarajah Narendran

Proceedings Volume 9954, Fifteenth International Conference on Solid State Lighting and LED-based Illumination Systems; 995405 (2016) https://doi.org/10.1117/12.2240424
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

The objective of this study was to investigate an indirect method of measuring the average junction temperature of a white organic light-emitting diode (OLED) based on temperature sensitivity differences in the radiant power emitted by individual emitter materials (i.e., “blue,” “green,” and “red”). The measured spectral power distributions (SPDs) of the white OLED as a function of temperature showed amplitude decrease as a function of temperature in the different spectral bands, red, green, and blue. Analyzed data showed a good linear correlation between the integrated radiance for each spectral band and the OLED panel temperature, measured at a reference point on the back surface of the panel. The integrated radiance ratio of the spectral band green compared to red, (G/R), correlates linearly with panel temperature. Assuming that the panel reference point temperature is proportional to the average junction temperature of the OLED panel, the G/R ratio can be used for estimating the average junction temperature of an OLED panel.

Citation Download Citation

Yiting Zhu and Nadarajah Narendran "A spectral measurement method for determining white OLED average junction temperatures", Proc. SPIE 9954, Fifteenth International Conference on Solid State Lighting and LED-based Illumination Systems, 995405 (22 September 2016); https://doi.org/10.1117/12.2240424

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