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Proceedings Article

Birefringent coherent diffraction imaging

[+] Author Affiliations
Dmitry Karpov, Hannah Rich, Boris Kiefer, E. Fohtung

New Mexico State Univ. (United States)

Tomy dos Santos Rolo

Karlsruhe Institute of Technology (Germany)

Yuriy Kryuchkov

Tomsk Polytechnic Univ. (Russian Federation)

Proc. SPIE 9931, Spintronics IX, 99312F (November 4, 2016); doi:10.1117/12.2235865
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From Conference Volume 9931

  • Spintronics IX
  • Henri-Jean Drouhin; Jean-Eric Wegrowe; Manijeh Razeghi
  • San Diego, California, United States | August 28, 2016

abstract

Directional dependence of the index of refraction contains a wealth of information about anisotropic optical properties in semiconducting and insulating materials. Here we present a novel high-resolution lens-less technique that uses birefringence as a contrast mechanism to map the index of refraction and dielectric permittivity in optically anisotropic materials. We applied this approach successfully to a liquid crystal polymer film using polarized light from helium neon laser. This approach is scalable to imaging with diffraction-limited resolution, a prospect rapidly becoming a reality in view of emergent brilliant X-ray sources. Applications of this novel imaging technique are in disruptive technologies, including novel electronic devices, in which both charge and spin carry information as in multiferroic materials and photonic materials such as light modulators and optical storage. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Dmitry Karpov ; Tomy dos Santos Rolo ; Hannah Rich ; Yuriy Kryuchkov ; Boris Kiefer, et al.
" Birefringent coherent diffraction imaging ", Proc. SPIE 9931, Spintronics IX, 99312F (November 4, 2016); doi:10.1117/12.2235865; http://dx.doi.org/10.1117/12.2235865


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