Experimental study of HgCdTe imaging sensor irradiated by pulse CO2 laser

Xi Wang; Qingsheng Wang; Hongtao Hu; Xiaodong Fang; Jinsong Nie

doi:10.1117/12.2243576

19 October 2016 Experimental study of HgCdTe imaging sensor irradiated by pulse CO₂ laser

Xi Wang, Qingsheng Wang, Hongtao Hu, Xiaodong Fang, Jinsong Nie

Proceedings Volume 10152, High Power Lasers, High Energy Lasers, and Silicon-based Photonic Integration; 1015202 (2016) https://doi.org/10.1117/12.2243576
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China

Abstract

The damages of TEA-CO₂ laser to HgCdTe imaging sensor are researched experimentally and theoretically. The shadows, cracks and dark line are observed. There is a gap between photosensitive layer and CdZnTe which decreases light transmittance, so that the shadows occur. It shows that the crack damages begin from photosensitive layer. The sensor is irradiated by pulse laser, the absorptivity of photosensitive layer is strong, sharp temperatures fluctuations inside the sensor, leading to stress. With the stress increased, the cracks are observed on the surface of the detector. Cracked the surface of the substrate, and effective transmission reduced, which caused gray pixel response decline. The dark line in image occurs several times because Hg atoms separate out from the detector and gather together at the Si-COMS which makes a short circuit between silicon substrate and signal choice line. The volatility of Hg makes the short circuit is unstable, resulting in the dark line repeated in the output image, but the short circuit occurs by chance.

Citation Download Citation

Xi Wang, Qingsheng Wang, Hongtao Hu, Xiaodong Fang, and Jinsong Nie "Experimental study of HgCdTe imaging sensor irradiated by pulse CO₂ laser", Proc. SPIE 10152, High Power Lasers, High Energy Lasers, and Silicon-based Photonic Integration, 1015202 (19 October 2016); https://doi.org/10.1117/12.2243576

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