Paper
25 October 2016 MBMW-101: World's 1st high-throughput multi-beam mask writer
Christof Klein, Elmar Platzgummer
Author Affiliations +
Abstract
The world’s first high throughput multi-beam mask writers (MBMW) have been realized by upgrading the existing MBMW Alpha and Beta tools with a 10x faster data path. In these tools a multi-beam column provides 262-thousand programmable beams of 20nm beam size. The current density is adjustable up to 1 A/cm2, resulting in a total beam current of up to 1 μA. With the upgraded 120 Gbps data path full field 7nm node layouts can be printed in less than 10 hours. This upgrade completes IMS’ first generation of multi-beam mask writers, which is called MBMW-101 and is meeting the requirements of the 7nm technology node.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christof Klein and Elmar Platzgummer "MBMW-101: World's 1st high-throughput multi-beam mask writer", Proc. SPIE 9985, Photomask Technology 2016, 998505 (25 October 2016); https://doi.org/10.1117/12.2243638
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications and 2 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photomasks

Optical proximity correction

Beam shaping

Inspection

Line width roughness

Vestigial sideband modulation

Optical microscopes

RELATED CONTENT

Writing accuracy of EBM-3500 electron-beam mask writing system
Proceedings of SPIE (September 05 2001)
Writing 32nm-hp contacts with curvilinear assist features
Proceedings of SPIE (September 24 2010)
Progress of UV-NIL template making
Proceedings of SPIE (May 11 2009)
MSB for ILT masks
Proceedings of SPIE (April 01 2011)

Back to Top