Paper
31 October 2016 En-face sectional imaging using single-shot full-field optical coherence tomography (SS-FF-OCT) based on white light emitting diode (WLED)
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Abstract
This work reports a Linnik type single shot full-field optical coherence tomography (SS-FF-OCT), which uses a fast generalized analytic signal based complex Riesz transform scheme to reconstruct wide area en-face OCT images. The OCT interferometer is illuminated using a single broad band white light emitting diode (WLED) (wavelength range 470- 850nm, central wavelength 650nm) and detection unit is a two-dimensional (2D) charge complementary metal oxide semiconductor (CMOS) camera. The measured axial and lateral resolution (using 4x, NA=0.1 microscope objective) of the present system is 0.9μm and 3.9μm, very close to theoretical values. The measured imaging area using CMOS camera is 2150 x 2150μm2. The feasibility of the system is demonstrated by imaging scattering samples such as onion bulk and plant leaf. The present SS-FF-OCT is compact, fast (Riesz transform based scheme), stable, cost-effective, and provides comparable axial resolution.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tulsi Anna, Chih-Ming Lai, Arthur Chiou, and Wen-Chuan Kuo "En-face sectional imaging using single-shot full-field optical coherence tomography (SS-FF-OCT) based on white light emitting diode (WLED)", Proc. SPIE 10024, Optics in Health Care and Biomedical Optics VII, 100243T (31 October 2016); https://doi.org/10.1117/12.2246197
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Cited by 1 scholarly publication.
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KEYWORDS
Optical coherence tomography

Imaging systems

Demodulation

Mirrors

CMOS cameras

Light sources

Interferometry

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