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2 November 2016 X-ray diffraction tomography of polycrystalline materials: present and future (Conference Presentation)
Stuart R. Stock, Jonathan D. Almer, Henrik Birkedal
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Proceedings Volume 9967, Developments in X-Ray Tomography X; 99670G (2016) https://doi.org/10.1117/12.2238863
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States
Abstract
Scattered x-radiation can be used for computed tomographic reconstruction of the distribution of crystallographic phases within the interior of specimens, and diffraction patterns can be measured for each volume element (voxel) within a reconstructed slice. This modality has been applied to systems as diverse as mineralized tissues and inorganic composites. Use of high energy x-rays (E < 40 keV) offers advantages including the ability to study volumes deep with specimens and to sample large ranges of reciprocal space, i.e., many reflections. The bases of diffraction tomography are reviewed, and the power of the technique is illustrated by the results obtained for specimens containing: a) different materials (SiC/Al composite), b) different polytypes (calcite/aragonite in a bivalve attachment system); c) mixtures of nanocrystalline and amorphous phases; d) a single phase, but volumes with different lattice parameters (hydroxyapatite, hAp, the mineral in bone and tooth); e) a single phase containing a spatial distribution of crystallographic texture (bone); a single phase with a spatial distribution of strains produced by in situ loading (bone). Finally, challenges and future directions are discussed.
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Stuart R. Stock, Jonathan D. Almer, and Henrik Birkedal "X-ray diffraction tomography of polycrystalline materials: present and future (Conference Presentation)", Proc. SPIE 9967, Developments in X-Ray Tomography X, 99670G (2 November 2016); https://doi.org/10.1117/12.2238863
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KEYWORDS
Tomography
Bone
Composites
Crystals
Diffraction
X-ray diffraction
X-rays
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