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2 November 2016 Measurements on semiconductor and scintillator detectors at the Advanced Light Source (Conference Presentation)
Giuseppe S. Camarda, Aleksey E. Bolotnikov, Yonggang Cui, Rubi Gul, Anwar Hossain, Utpal N. Roy, Ge Yang, Ralph B. James, Peter E. Vanier
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Proceedings Volume 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII; 996810 (2016) https://doi.org/10.1117/12.2240169
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States
Abstract
During the transition period between closure of Beamline X27B at BNL’s NSLS and the opening of Beamline MID at NSLS-II, we began operation of LBNL’s ALS Beamline 3.3.2 to carry out our radiation detection materials RD. Measurements performed at this Beamline include, X-ray Detector Response Mapping and White Beam X-ray Diffraction Topography (WBXDT), among others. We will introduce the capabilities of the Beamline and present the most recent results obtained on CdZnTe and scintillators. The goal of the studies on CdZnTe is to understand the origin and effects of subgrain boundaries and help to visualize the presence of a higher concentration of impurities, which might be responsible for the deterioration of the energy resolution and response uniformity in the vicinity of the sub-grain boundaries. The results obtained in the second year of measurements will be presented.
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Giuseppe S. Camarda, Aleksey E. Bolotnikov, Yonggang Cui, Rubi Gul, Anwar Hossain, Utpal N. Roy, Ge Yang, Ralph B. James, and Peter E. Vanier "Measurements on semiconductor and scintillator detectors at the Advanced Light Source (Conference Presentation)", Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 996810 (2 November 2016); https://doi.org/10.1117/12.2240169
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KEYWORDS
Scintillators
Sensors
Light sources
Semiconductors
Visualization
X-ray detectors
X-ray diffraction
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