Coplanar three-beam interference and phase edge dislocations

Krzysztof Patorski; Łukasz Służewski; Maciej Trusiak; Krzysztof Pokorski

doi:10.1117/12.2261821

23 December 2016 Coplanar three-beam interference and phase edge dislocations

Krzysztof Patorski, Łukasz Służewski, Maciej Trusiak, Krzysztof Pokorski

Proceedings Volume 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 101420X (2016) https://doi.org/10.1117/12.2261821
Event: 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2016, Jasna, Slovakia

Abstract

We present a comprehensive analysis of grating three-beam interference to discover a broad range of the ratio of amplitudes A of +/-1 diffraction orders and the zero order amplitude C providing phase edge dislocations. We derive a condition A/C > 0.5 for the occurrence of phase edge dislocations in three-beam interference self-image planes. In the boundary case A/C = 0.5 singularity conditions are met in those planes (once per interference field period), but the zero amplitude condition is not accompanied by an abrupt phase change. For A/C > 0.5 two adjacent singularities in a single field period show opposite sign topological charges. The occurrence of edge dislocations for selected values of A/C was verified by processing fork fringes obtained by introducing the fourth beam in the plane perpendicular to the one containing three coplanar diffraction orders. Two fork pattern processing methods are described, 2D CWT (two-dimensional continuous wavelet transform) and 2D spatial differentiation.

Citation Download Citation

Krzysztof Patorski, Łukasz Służewski, Maciej Trusiak, and Krzysztof Pokorski "Coplanar three-beam interference and phase edge dislocations", Proc. SPIE 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 101420X (23 December 2016); https://doi.org/10.1117/12.2261821

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KEYWORDS

Spiral phase plates

Continuous wavelet transforms

Diffraction gratings

Modulation

Fringe analysis

Phase shift keying

Diffraction

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