Presentation + Paper
7 March 2017 Direct laser interference patterning of metallic sleeves for roll-to-roll hot embossing
Valentin Lang, Andreas Rank, Andrés F. Lasagni
Author Affiliations +
Abstract
Surfaces equipped with periodic patterns with feature sizes in the micrometer, submicrometer and nanometer range present outstanding surface properties. Many of these surfaces can be found on different plants and animals. However, there are few methods capable to produce such patterns in a one-step process on relevant technological materials. Direct laser interference patterning (DLIP) provides both high resolution as well as high throughput. Recently, fabrication rates up to 1 m2·min-1 could be achieved. However, resolution was limited to a few micrometers due to typical thermal effects that arise when nanosecond pulsed laser systems are used. Therefore, this study introduces an alternative to ns-DLIP for the fabrication of multi-scaled micrometer and submicrometer structures on nickel surfaces using picosecond pulses (10 ps at a wavelength of 1064 nm). Due to the nature of the interaction process of the metallic surfaces with the ultrashort laser pulses, it was not only possible to directly transfer the shape of the interference pattern intensity distribution to the material (with spatial periods ranging from 1.5 μm to 5.7 μm), but also to selectively obtain laser induce periodic surface structures with feature sizes in the submicrometer and nanometer range. Finally, the structured nickel sleeves are utilized in a roll-to-roll hot embossing unit for structuring of polymer foils. Processing speeds up to 25 m·min-1 are reported.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Valentin Lang, Andreas Rank, and Andrés F. Lasagni "Direct laser interference patterning of metallic sleeves for roll-to-roll hot embossing", Proc. SPIE 10092, Laser-based Micro- and Nanoprocessing XI, 100920T (7 March 2017); https://doi.org/10.1117/12.2252623
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Nickel

Positron emission tomography

Optical lithography

Picosecond phenomena

Confocal microscopy

Electron beam lithography

Laser ablation

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