Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers

Ivan Radevici; Jonna Tiira; Jani Oksanen

doi:10.1117/12.2249978

17 February 2017 Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers

Ivan Radevici, Jonna Tiira, Jani Oksanen

Proceedings Volume 10121, Optical and Electronic Cooling of Solids II; 101210Q (2017) https://doi.org/10.1117/12.2249978
Event: SPIE OPTO, 2017, San Francisco, California, United States

Abstract

Developing optical cooling technologies requires access to reliable efficiency measurement techniques and ability to detect spatial variations in the efficiency and light emission of the devices. We investigate the possibility to combine the calorimetric efficiency measurement principles with lock-in thermography (LIT) and conventional luminescence microscopy to enable spatially resolved measurement of the efficiency, current spreading and local device heating of double diode structures (DDS) serving as test vessels for developing thermophotonic cooling devices. Our approach enables spatially resolved characterization and localization of the losses of the double diode structures as well as other light emitting semiconductor devices. In particular, the approach may allow directly observing effects like current crowding and surface recombination on the light emission and heating of the DDS devices.

Citation Download Citation

Ivan Radevici, Jonna Tiira, and Jani Oksanen "Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers", Proc. SPIE 10121, Optical and Electronic Cooling of Solids II, 101210Q (17 February 2017); https://doi.org/10.1117/12.2249978

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