Advanced temporal characterization of free electron laser pulses at European XFEL by THz photoelectron spectroscopy

Jia Liu; Jan Grünert

doi:10.1117/12.2253138

24 February 2017 Advanced temporal characterization of free electron laser pulses at European XFEL by THz photoelectron spectroscopy

Jia Liu, Jan Grünert

Author Affiliations +

Proceedings Volume 10103, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X; 101030E (2017) https://doi.org/10.1117/12.2253138
Event: SPIE OPTO, 2017, San Francisco, California, United States

Abstract

We report an on-going temporal characterization project and method on a shot-to-shot basis for free electron laser pulses by using THz photoelectron spectroscopy at the European XFEL facility. Shot to shot FEL time jitter and pulse profile information can be reconstructed by resolving the photoelectrons energy spectra in an external THz field. Laser based THz generation and optimization, photoelectron generation and detection are described. Further considerations of the temporal resolution based on proposed photoelectron lines are presented and intuitive simulations are made to demonstrate the feasibility of such technique.

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Citation Download Citation

Jia Liu and Jan Grünert "Advanced temporal characterization of free electron laser pulses at European XFEL by THz photoelectron spectroscopy", Proc. SPIE 10103, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X, 101030E (24 February 2017); https://doi.org/10.1117/12.2253138

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