Paper
28 February 2017 The 3D measurement techniques for ancient architecture and historical relics
Author Affiliations +
Proceedings Volume 10256, Second International Conference on Photonics and Optical Engineering; 102562L (2017) https://doi.org/10.1117/12.2257460
Event: Second International Conference on Photonics and Optical Engineering, 2016, Xi'an, China
Abstract
Nowadays, 3D measurement and re-construction technologies are widely used not only in industry area, but also in the appreciation and research of ancient architecture and historical relics. Many methods are used for the architecture measurement in large scale, but as for the details of architecture or precision historical relics, these methods meet difficulties. Thus, historical relic objects with specular surface or complex sculptural surface could not be measured by traditional method. Focusing on these problems, this paper proposed 3D measurement technique which contains two levels of measurement. Firstly, when measuring ancient architecture in large scale, laser scanning and photometry methods are used. Then, when measuring details of architecture, a fast and adaptive 3D measurement system is used. Multi-view registration is also used for the measurement of hollowed-out structure of sculptural relics. The experiments indicate that the system can achieve 3D measurement and re-construction of different types of ancient architecture and historical relics.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huijie Zhao, Xiaochun Diao, Hongzhi Jiang, and Zhiyong Zhao "The 3D measurement techniques for ancient architecture and historical relics", Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102562L (28 February 2017); https://doi.org/10.1117/12.2257460
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
3D metrology

Image registration

Laser scanners

Photometry

Back to Top