Presentation + Paper
28 April 2017 Analysis of speckle and material properties in laider tracer
Author Affiliations +
Abstract
The SAL simulation tool Laider Tracer models speckle: the random variation in intensity of an incident light beam across a rough surface. Within Laider Tracer, the speckle field is modeled as a 2-D array of jointly Gaussian random variables projected via ray tracing onto the scene of interest. Originally, all materials in Laider Tracer were treated as ideal diffuse scatterers, for which the far-field return computed uses the Lambertian Bidirectional Reflectance Distribution Function (BRDF). As presented here, we implement material properties into Laider Tracer via the Non-conventional Exploitation Factors Data System: a database of properties for thousands of different materials sampled at various wavelengths and incident angles. We verify the intensity behavior as a function of incident angle after material properties are added to the simulation.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jacob W. Ross, Brian D. Rigling, and Edward A. Watson "Analysis of speckle and material properties in laider tracer", Proc. SPIE 10201, Algorithms for Synthetic Aperture Radar Imagery XXIV, 1020102 (28 April 2017); https://doi.org/10.1117/12.2261157
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Bidirectional reflectance transmission function

Electroluminescence

Speckle

Data modeling

Databases

Sensors

Computer simulations

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