Presentation
28 April 2017 Photo-induced force measurements with femtosecond pulses (Conference Presentation)
Author Affiliations +
Proceedings Volume 10120, Complex Light and Optical Forces XI; 1012015 (2017) https://doi.org/10.1117/12.2254560
Event: SPIE OPTO, 2017, San Francisco, California, United States
Abstract
Raman spectroscopy can provide useful chemical information of nanostructures and molecules. We combine Raman spectroscopy with atomic force microscopy, through dual color photo-induced force microscopy (PiFM). In this modality, images with Raman contrast can be generated with a spatial resolution well below 10 nm at ambient temperature and pressure. Here we utilize this technique to visualize molecules on surfaces with high spatial and temporal resolution. Compared to previous Raman sensitive PiFM measurements, we employ femtosecond pulses and show that this technique is highly sensitive to the stimulated Raman scattering interaction in the molecule.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryan M. Khan, Bongsu Kim, Junghoon Jahng, and Eric O. Potma "Photo-induced force measurements with femtosecond pulses (Conference Presentation)", Proc. SPIE 10120, Complex Light and Optical Forces XI, 1012015 (28 April 2017); https://doi.org/10.1117/12.2254560
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KEYWORDS
Raman spectroscopy

Femtosecond phenomena

Molecules

Atomic force microscopy

Microscopy

Molecular spectroscopy

Nanostructures

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