Presentation
9 June 2017 Measurement of spectral phase noise in a cryogenically cooled Ti:Sa amplifier (Conference Presentation)
Roland S. Nagymihaly, Péter Jójárt, Ádám Börzsönyi, Károly Osvay
Author Affiliations +
Abstract
In most of cases the drift of the carrier envelope phase (CEP) of a chirped pulse amplifier (CPA) system is determined only [1], being the relevant parameter at laser-matter interactions. The need of coherent combination of multiple amplifier channels to further increase the peak power of pulses requires interferometric precision [2]. For this purpose, the stability of the group delay of the pulses may become equally important. Further development of amplifier systems requires the investigation of phase noise contributions of individual subsystems, like amplifier stages. Spectrally resolved interferometry (SRI), which is a completely linear optical method, makes the measurement of spectral phase noise possible of basically any part of a laser system [3]. By utilizing this method, the CEP stability of water-cooled Ti:Sa based amplifiers was investigated just recently, where the effects of seed and pump energy, repetition rate, and the cooling crystal mounts were thoroughly measured [4]. We present a systematic investigation on the noise of the spectral phase, including CEP, of laser pulses amplified in a cryogenically-cooled Ti:Sa amplifier of a CPA chain. The double-pass amplifier was built in the sample arm of a compact Michelson interferometer. The Ti:Sa crystal was cooled below 30 °K. The inherent phase noise was measured for different operation modes, as at various repetition rates, and pump depletion. Noise contributions of the vacuum pumps and the cryogenic refrigerator were found to be 43 and 47 mrad, respectively. We have also identified CEP noise having thermal as well as mechanical origin. Both showed a monotonically decreasing tendency towards higher repetition rates. We found that the widths of the noise distributions are getting broader towards lower repetition rates. Spectral phase noise with and without amplification was measured, and we found no significant difference in the phase noise distributions. The mechanical vibration was also measured in the setup by using an accelerometer synchronously with the optical measurements. The noise spectra of phase and vibration measurements were compared and the sources of individual noise components were identified. References [1] Sebastian Koke et al, Opt. Lett. 33, 2545-2547 (2008). [2] J. Limpert et al, IEEE J. of Sel. Top. in Quant. El. 20, 0901810 (2014). [3] A. Borzsonyi, A.P. Kovacs, K. Osvay, Appl. Sci. 3, 515-544 (2013). [4] A. Borzsonyi, R.S. Nagymihaly, K. Osvay, Las. Phys. Lett. 13, 015301 (2016).
Conference Presentation
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Roland S. Nagymihaly, Péter Jójárt, Ádám Börzsönyi, and Károly Osvay "Measurement of spectral phase noise in a cryogenically cooled Ti:Sa amplifier (Conference Presentation)", Proc. SPIE 10238, High-Power, High-Energy, and High-Intensity Laser Technology III, 102380D (9 June 2017); https://doi.org/10.1117/12.2265281
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KEYWORDS
Optical amplifiers

Phase measurement

Crystals

Interferometry

Cryogenics

Laser interferometry

Laser systems engineering

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