Paper
15 June 2017 Dynamic metrology and data processing for precision freeform optics fabrication and testing
Author Affiliations +
Proceedings Volume 10326, Fourth European Seminar on Precision Optics Manufacturing; 103260H (2017) https://doi.org/10.1117/12.2272353
Event: Fourth European Seminar on Precision Optics Manufacturing, 2017, Teisnach, Germany
Abstract
Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maham Aftab, Isaac Trumper, Lei Huang, Heejoo Choi, Wenchuan Zhao, Logan Graves, Chang Jin Oh, and Dae Wook Kim "Dynamic metrology and data processing for precision freeform optics fabrication and testing", Proc. SPIE 10326, Fourth European Seminar on Precision Optics Manufacturing, 103260H (15 June 2017); https://doi.org/10.1117/12.2272353
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Deflectometry

Metrology

Freeform optics

Optical testing

Data processing

Interferometry

Deformable mirrors

Back to Top