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Proceedings Article

Wide-field reflection phase microscope

[+] Author Affiliations
Zahid Yaqoob, Dan Fu, Ramachandra R. Dasari, Michael S. Feld

Massachusetts Institute of Technology (USA)

Toyohiko Yamauchi

Hamamatsu Photonics K.K. (Japan)

Wonshik Choi

Korea Univ. (Korea, Republic of)

Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79040T (February 22, 2011); doi:10.1117/12.875877
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From Conference Volume 7904

  • Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII
  • Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown
  • San Francisco, California, USA | January 22, 2011

abstract

Wide-field reflection phase microscopy is highly desired for depth-resolved measurement of cellular structures without the need for raster scanning. We report a low coherence reflection phase microscope based on time-domain optical coherence tomography and off-axis interferometry. The setup uniquely provides the desired angular shift to the reference beam for off-axis interferometry while promising equal path length across the whole reference beam. We show sub-nanometer path-length sensitivity of our instrument and demonstrate high-speed imaging of membrane fluctuations in eukaryotic cells.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Zahid Yaqoob ; Toyohiko Yamauchi ; Dan Fu ; Wonshik Choi ; Ramachandra R. Dasari, et al.
"Wide-field reflection phase microscope", Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79040T (February 22, 2011); doi:10.1117/12.875877; http://dx.doi.org/10.1117/12.875877


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