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Proceedings Article

Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft x-ray beams

[+] Author Affiliations
Mark E. Siemens

Univ. of Denver (USA) and Univ. of Colorado at Boulder (USA)

Qing Li, Ronggui Yang, Margaret M. Murnane, Henry C. Kapteyn

Univ. of Colorado at Boulder (USA)

Keith A. Nelson

Massachusetts Institute of Technology (USA)

Erik H. Anderson

Lawrence Berkeley National Lab. (USA)

Proc. SPIE 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV, 793716 (February 21, 2011); doi:10.1117/12.871455
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From Conference Volume 7937

  • Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV
  • Kong-Thon Tsen; Jin-Joo Song; Markus Betz; Abdulhakem Y. Elezzabi
  • San Francisco, California | January 22, 2011
Abstract
References

abstract

Heat dissipation from a nanoscale hot-spot is expected to be non-diffusive when a hot-spot is smaller than the phonon mean free path of the substrate. Our technique of observing diffraction of coherent soft x-ray pulses allows for very high resolution (~pm) of thermally-induced surface distortion, as well as femtosecond time resolution of dynamics. We successfully model our experimental results with a diffusive transport model that is modified to include an additional boundary resistance. These results confirm the importance of considering ballistic transport away from a nanoscale heat source, and identify a means of correctly accounting for this ballistic transport.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Mark E. Siemens ; Qing Li ; Ronggui Yang ; Keith A. Nelson ; Erik H. Anderson, et al.
"Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft x-ray beams", Proc. SPIE 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV, 793716 (February 21, 2011); doi:10.1117/12.871455; http://dx.doi.org/10.1117/12.871455


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