Chromatic dispersion measurement of nano-silicon waveguides using a white-light interferometry method

Seung Hwan Kim; Seoung Hun Lee; Dong Wook Kim; Kyong Hon Kim; El-Hang Lee; Jong-Moo Lee

doi:10.1117/12.874004

18 January 2011 Chromatic dispersion measurement of nano-silicon waveguides using a white-light interferometry method

Seung Hwan Kim, Seoung Hun Lee, Dong Wook Kim, Kyong Hon Kim, El-Hang Lee, Jong-Moo Lee

Proceedings Volume 7942, Optoelectronic Integrated Circuits XIII; 79420R (2011) https://doi.org/10.1117/12.874004
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

We report a white-light Mach-Zehnder interferometry method for an accurate measurement of spectral distribution of the chromatic dispersion coefficient of very short optical waveguides over a wavelength range of 1520~1560 nm. The chromatic dispersion curve of a 7.6 mm long silicon nano-waveguide of 400 nm width and 250 nm height was successfully measured by confirming the method with standard single-mode fibers up to 3 cm length, for which its total chromatic dispersion is as small as 0.51 fs/nm. This method will be very useful for determination of chromatic dispersion profile of compact nanowaveguide devices.

Citation Download Citation

Seung Hwan Kim, Seoung Hun Lee, Dong Wook Kim, Kyong Hon Kim, El-Hang Lee, and Jong-Moo Lee "Chromatic dispersion measurement of nano-silicon waveguides using a white-light interferometry method", Proc. SPIE 7942, Optoelectronic Integrated Circuits XIII, 79420R (18 January 2011); https://doi.org/10.1117/12.874004

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