X-ray fluorescence tomography using imaging detectors

Ling-Jian Meng; Geng Fu; Nan Li; Matt Newville; Peter Eng; Patrick La Rivière

doi:10.1117/12.860957

20 September 2010 X-ray fluorescence tomography using imaging detectors

Ling-Jian Meng, Geng Fu, Nan Li, Matt Newville, Peter Eng, Patrick La Rivière

Proceedings Volume 7804, Developments in X-Ray Tomography VII; 78041B (2010) https://doi.org/10.1117/12.860957
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

This paper presents a feasibility study of using emission tomography (ET) systems for synchrotron X-ray fluorescence computer tomography (XFCT). The proposed detection system combines high-resolution semiconductor detectors with multiple-pinhole apertures. The key advantage of using an ET-based detection system is that 3D distributions of trace elements can be built up with much reduced scanning motion and potentially without need for tomographic reconstruction. In comparison to the conventional line-by-line scanning scheme, the ET-based imaging system allows a great reduction in imaging time, which has been one of the major hurdles for current XFCT studies. In order to compare different imaging schemes for XFCT studies, we developed an analytical performance index that is based on the fundamental tradeoffs between image noise and spatial resolution achievable with given detection configurations. To further demonstrate the feasibility of using SPECT apertures for XFCT, a prototype CCD-based multiple-pinhole imaging system was set up at the Advanced Photon Source (APS) for imaging phantoms that contain solutions of several trace metals. Simultaneously acquired 3D distributions of these elements are presented.

Citation Download Citation

Ling-Jian Meng, Geng Fu, Nan Li, Matt Newville, Peter Eng, and Patrick La Rivière "X-ray fluorescence tomography using imaging detectors", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78041B (20 September 2010); https://doi.org/10.1117/12.860957

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available