High accuracy laser based machine vision for calibration of linear encoders and dial instruments

Iuliana Iordache; Paul Schiopu; Dan Apostol; Victor Damian

doi:10.1117/12.882819

7 December 2010 High accuracy laser based machine vision for calibration of linear encoders and dial instruments

Iuliana Iordache, Paul Schiopu, Dan Apostol, Victor Damian

Proceedings Volume 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V; 782125 (2010) https://doi.org/10.1117/12.882819
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, 2010, Constanta, Romania

Abstract

A laser interferometer, a vision system, and 1-D precision translation stage are used to develop a high precision measuring station with a working range of 12 mm. The object inspected by the laser-and-vision system is moved using a linear translation stage (LUMINOS INDUSTRIES I1000 - 1-Axis Stage) so that the camera can take images of the feature points of the object at two (or more) different positions. Meanwhile, the displacement of the table is measured using a laser interferometer. Putting these two feature points successively in focus the distance between them can be evaluated and adding the displacement measured by the laser interferometer, the real distance between these two feature points is obtained. The developed 1-D laser-and-vision measuring system is used to measure the geometric size (pitch) of grating type linear encoders or industrial line scales. Software counts automatically the number of lines and the laser interferometer produces the corresponding length. For dial instruments the vision machine observes the coincidence of the moving needle with divisions representing (sub) units of length. The displacements measured by laser interferometer are compared with dial indicator and the measuring errors are observed.

Citation Download Citation

Iuliana Iordache, Paul Schiopu, Dan Apostol, and Victor Damian "High accuracy laser based machine vision for calibration of linear encoders and dial instruments", Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782125 (7 December 2010); https://doi.org/10.1117/12.882819

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