Paper
24 September 2010 Fundamental study of droplet spray characteristics in photomask cleaning for advanced lithography
C. L. Lu, C. H. Yu, W. H. Liu, Luke Hsu, Angus Chin, S. C. Lee, Anthony Yen, Gaston Lee, Peter Dress, Sherjang Singh, Uwe Dietze
Author Affiliations +
Abstract
The fundamentals of droplet-based cleaning of photomasks are investigated and performance regimes that enable the use of binary spray technologies in advanced mask cleaning are identified. Using phase Doppler anemometry techniques, the effect of key performance parameters such as liquid and gas flow rates and temperature, nozzle design, and surface distance on droplet size, velocity, and distributions were studied. The data are correlated to particle removal efficiency (PRE) and feature damage results obtained on advanced photomasks for 193-nm immersion lithography.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. L. Lu, C. H. Yu, W. H. Liu, Luke Hsu, Angus Chin, S. C. Lee, Anthony Yen, Gaston Lee, Peter Dress, Sherjang Singh, and Uwe Dietze "Fundamental study of droplet spray characteristics in photomask cleaning for advanced lithography", Proc. SPIE 7823, Photomask Technology 2010, 782325 (24 September 2010); https://doi.org/10.1117/12.864303
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Cited by 2 scholarly publications.
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KEYWORDS
Binary data

Particles

Photomasks

SRAF

Nitrogen

Personal digital assistants

Liquids

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