Paper
17 November 2010 Flat-top steep-edge response of photodetetors by circuit control method
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Abstract
This paper proposes a circuit control method achieving the flat-top steep-edge response of photodetectors. The response is realized using three wavelength selective photodetectors and the circuit which consists of amplifiers, comparators and a AND gate. Two groups of experiments were carried out. In group 1, 0.5dB, 3dB, 20dB bandwidths are 2.76nm, 3.29nm, 4.58nm from 1546nm to 1549.3nm. In group 2, 0.5dB, 3dB, 20dB bandwidths are 3.19nm, 2.89nm, 3.06nm from 1554.8nm to 1557.6nm. The results of experiments show that the desirable flat-top steep-edge response can be gained and the response linewidth is adjustable by selecting different photodetectors, so that the requirement of the WDM system and the network can be met. The method is easy to realize with low cost and has wide application in optical measurements and optical processing etc.
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Li Wang, Yongqing Huang, Xiaofeng Duan, Qiang Yan, Xiaomin Ren, Hui Huang, Qi Wang, and Xia Zhang "Flat-top steep-edge response of photodetetors by circuit control method", Proc. SPIE 7847, Optoelectronic Devices and Integration III, 78472E (17 November 2010); https://doi.org/10.1117/12.869964
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KEYWORDS
Photodetectors

Optical amplifiers

Wavelength division multiplexing

Networks

Optical signal processing

Optical testing

Lithium

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