Paper
16 February 2011 Nonlinear time dependence of dark current in charge-coupled devices
Justin C. Dunlap, Erik Bodegom, Ralf Widenhorn
Author Affiliations +
Proceedings Volume 7875, Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII; 78750H (2011) https://doi.org/10.1117/12.871962
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States
Abstract
It is generally assumed that charge-coupled device (CCD) imagers produce a linear response of dark current versus exposure time except near saturation. We found a large number of pixels with nonlinear dark current response to exposure time to be present in two scientific CCD imagers. These pixels are found to exhibit distinguishable behavior with other analogous pixels and therefore can be characterized in groupings. Data from two Kodak CCD sensors are presented for exposure times from a few seconds up to two hours. Linear behavior is traditionally taken for granted when carrying out dark current correction and as a result, pixels with nonlinear behavior will be corrected inaccurately.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Justin C. Dunlap, Erik Bodegom, and Ralf Widenhorn "Nonlinear time dependence of dark current in charge-coupled devices", Proc. SPIE 7875, Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII, 78750H (16 February 2011); https://doi.org/10.1117/12.871962
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Cameras

Imaging systems

Electrons

Charge-coupled devices

Sensors

CCD image sensors

Silicon

Back to Top