Paper
3 June 2010 Optimal compression and binarization of signature profiles for automated bullet identification systems
Wei Chu, John Song, Theodore Vorburger, Robert Thompson, Thomas Renegar, Richard Silver
Author Affiliations +
Proceedings Volume 7729, Scanning Microscopy 2010; 77291C (2010) https://doi.org/10.1117/12.859858
Event: Scanning Microscopy 2010, 2010, Monterey, California, United States
Abstract
In some automated bullet identification systems, the similarity of striation marks between different bullets is measured using the cross correlation function of the compressed signature profile extracted from a land impression. Inclusion of invalid areas weakly striated by barrel features may lead to sub-optimal extraction of the signature profile and subsequent deterioration of correlation results. In this paper, a method for locating striation marks and selecting valid correlation areas based on an edge detection technique is proposed for the optimal extraction of the compressed signature profiles. Experimental results from correlating 48 bullets fired from 12 gun barrels of 6 manufacturers have demonstrated a higher correct matching rate than the previous study results without correlation area selection processing. Furthermore, an attempt to convert a traditional profile with multiple z-quantization (or gray scale) levels into a binary profile is made for the purpose of reducing storage space and increasing correlation speed.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Chu, John Song, Theodore Vorburger, Robert Thompson, Thomas Renegar, and Richard Silver "Optimal compression and binarization of signature profiles for automated bullet identification systems", Proc. SPIE 7729, Scanning Microscopy 2010, 77291C (3 June 2010); https://doi.org/10.1117/12.859858
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Cited by 2 scholarly publications.
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KEYWORDS
Edge detection

Image processing

System identification

Firearms

Binary data

Microscopes

Forensic science

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