Paper
7 June 2010 Electron microscopy of polymer-carbon nanotubes composites
E. M. Campo, H. Campanella, Y. Y. Huang, K. Zinoviev, N. Torras, C. Tamargo, D. Yates, L. Rotkina, J. Esteve, E. M. Terentjev
Author Affiliations +
Proceedings Volume 7729, Scanning Microscopy 2010; 772904 (2010) https://doi.org/10.1117/12.867718
Event: Scanning Microscopy 2010, 2010, Monterey, California, United States
Abstract
Characterization of polymer nanocomposites by electron microscopy has been attempted since last decade. Main drives for this effort were analysis of dispersion and alignment of fillers in the matrix. Sample preparation, imaging modes and irradiation conditions became particularly challenging due to the small dimension of the fillers and also to the mechanical and conductive differences between filler and matrix. To date, no standardized dispersion and alignment process or characterization procedures exist in the trade. Review of current state of the art on characterization of polymer nanocomposites suggests that the most innovative electron and ion beam microscopy has not yet been deployed in this material system. Additionally, recently discovered functionalities of these composites, such as electro and photoactuation are amenable to the investigation of the atomistic phenomena by in situ transmission electron microscopy. The possibility of using innovative thinning techniques is presented.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. M. Campo, H. Campanella, Y. Y. Huang, K. Zinoviev, N. Torras, C. Tamargo, D. Yates, L. Rotkina, J. Esteve, and E. M. Terentjev "Electron microscopy of polymer-carbon nanotubes composites", Proc. SPIE 7729, Scanning Microscopy 2010, 772904 (7 June 2010); https://doi.org/10.1117/12.867718
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polymers

Composites

Transmission electron microscopy

Nanocomposites

Electron microscopy

Scanning electron microscopy

Sensors

Back to Top