Paper
3 June 2010 Optimizing the detector configuration for SEM topographic contrast by using a Monte Carlo simulation
Makoto Suzuki, Sergey Borisov, Sergey Babin, Hiroyuki Ito
Author Affiliations +
Proceedings Volume 7729, Scanning Microscopy 2010; 772910 (2010) https://doi.org/10.1117/12.859775
Event: Scanning Microscopy 2010, 2010, Monterey, California, United States
Abstract
The relation between detector geometry and image contrast was studied using the Monte Carlo simulator, CHARIOT. The simulator is capable of modeling electron scattering in the specimen, but it can also model the electron trajectories outside the specimen under 3-D electric and magnetic fields as well as the detector energy response. SEM images of 10 nm thick structures on a flat substrate were examined. The results demonstrate that the image contrast changes more drastically by changing the angular window of the detector, rather than by changing the energy response function of the detector. Particularly, it is shown to be possible to optimize the image contrast and the contrast-to-noise ratio of the SEM image. The information obtained is useful for designing the SEM detector for specific applications.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Makoto Suzuki, Sergey Borisov, Sergey Babin, and Hiroyuki Ito "Optimizing the detector configuration for SEM topographic contrast by using a Monte Carlo simulation", Proc. SPIE 7729, Scanning Microscopy 2010, 772910 (3 June 2010); https://doi.org/10.1117/12.859775
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Cited by 3 scholarly publications.
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KEYWORDS
Sensors

Monte Carlo methods

Scanning electron microscopy

Signal detection

Signal processing

Interference (communication)

3D modeling

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