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Proceedings Article

Broadband soft x-ray polarimetry

[+] Author Affiliations
Herman L. Marshall, Ralf K. Heilmann, Norbert S. Schulz, Kendrah D. Murphy

Massachusetts Institute of Technology (USA)

Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77320F (July 30, 2010); doi:10.1117/12.857443
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From Conference Volume 7732

  • Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
  • Monique Arnaud; Stephen S. Murray; Tadayuki Takahashi
  • San Diego, California, USA | June 27, 2010

abstract

We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Herman L. Marshall ; Ralf K. Heilmann ; Norbert S. Schulz and Kendrah D. Murphy
"Broadband soft x-ray polarimetry", Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77320F (July 30, 2010); doi:10.1117/12.857443; http://dx.doi.org/10.1117/12.857443


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