Design, performance, and early results from extremely high Doppler precision instruments in a global network

Jian Ge; Bo Zhao; John Groot; Liang Chang; Frank Varosi; Xiaoke Wan; Scott Powell; Peng Jiang; Kevin Hanna; Ji Wang; Rohan Pais; Jian Liu; Liming Dou; Sidney Schofield; Shaun McDowell; Erin Costello; Adriana Delgado-Navarro; Scott Fleming; Brian Lee; Sandeep Reddy Bollampally; Troy Bosman; Hali Jakeman; Adam Fletcher; Gabriel Marquez

doi:10.1117/12.857366

14 July 2010 Design, performance, and early results from extremely high Doppler precision instruments in a global network

Jian Ge, Bo Zhao, John Groot, Liang Chang, Frank Varosi, Xiaoke Wan, Scott Powell, Peng Jiang, Kevin Hanna, Ji Wang, Rohan Pais, Jian Liu, Liming Dou, Sidney Schofield, Shaun McDowell, Erin Costello, Adriana Delgado-Navarro, Scott Fleming, Brian Lee, Sandeep Reddy Bollampally, Troy Bosman, Hali Jakeman, Adam Fletcher, Gabriel Marquez

Author Affiliations +

Proceedings Volume 7735, Ground-based and Airborne Instrumentation for Astronomy III; 77350H (2010) https://doi.org/10.1117/12.857366
Event: SPIE Astronomical Telescopes + Instrumentation, 2010, San Diego, California, United States

Abstract

We report design, performance and early results from two of the Extremely High Precision Extrasolar Planet Tracker Instruments (EXPERT) as part of a global network for hunting for low mass planets in the next decade. EXPERT is a combination of a thermally compensated monolithic Michelson interferometer and a cross-dispersed echelle spectrograph for extremely high precision Doppler measurements for nearby bright stars (e.g., 1m/s for a V=8 solar type star in 15 min exposure). It has R=18,000 with a 72 micron slit and a simultaneous coverage of 390-694 nm. The commissioning results show that the instrument has already produced a Doppler precision of about 1 m/s for a solar type star with S/N~100 per pixel. The instrument has reached ~4 mK (P-V) temperature stability, ~1 mpsi pressure stability over a week and a total instrument throughput of ~30% at 550 nm from the fiber input to the detector. EXPERT also has a direct cross-dispersed echelle spectroscopy mode fed with 50 micron fibers. It has spectral resolution of R=27,000 and a simultaneous wavelength coverage of 390-1000 nm.

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Jian Ge, Bo Zhao, John Groot, Liang Chang, Frank Varosi, Xiaoke Wan, Scott Powell, Peng Jiang, Kevin Hanna, Ji Wang, Rohan Pais, Jian Liu, Liming Dou, Sidney Schofield, Shaun McDowell, Erin Costello, Adriana Delgado-Navarro, Scott Fleming, Brian Lee, Sandeep Reddy Bollampally, Troy Bosman, Hali Jakeman, Adam Fletcher, and Gabriel Marquez "Design, performance, and early results from extremely high Doppler precision instruments in a global network", Proc. SPIE 7735, Ground-based and Airborne Instrumentation for Astronomy III, 77350H (14 July 2010); https://doi.org/10.1117/12.857366

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