SEM image modeling using the modular Monte Carlo model MCSEM

K.-P. Johnsen; C. G. Frase; H. Bosse; D. Gnieser

doi:10.1117/12.846543

1 April 2010 SEM image modeling using the modular Monte Carlo model MCSEM

K.-P. Johnsen, C. G. Frase, H. Bosse, D. Gnieser

Proceedings Volume 7638, Metrology, Inspection, and Process Control for Microlithography XXIV; 76381O (2010) https://doi.org/10.1117/12.846543
Event: SPIE Advanced Lithography, 2010, San Jose, California, United States

Abstract

We present the Monte Carlo simulation program MCSEM, developed at the Physikalisch-Technische Bundesanstalt (PTB), Germany, for the simulation of Scanning Electron Microscopy (SEM) image formation at arbitrary specimen structures (e.g. layout structures of wafers or photomasks). The program simulates the different stages of the SEM image formation process: the probe forming, the probe-sample interaction and the detection process. A modular program structure is used for an easy adaptation of the program to new simulation tasks. Arbitrarily shaped 3D structured specimen models can be applied and different electron probe shapes are modeled. Various physical models for electron scattering in solid state material are included. Secondary electron (SE) detection modeling is based on SE raytracing, detectors for backscattered electrons (BSE) and transmitted electrons (TE) are also available. An electromagnetic field solver is used to simulate charging of the specimen and the transport of the SE within the electromagnetic field. Some examples of simulation results are presented together with comparisons with experimental results.

Citation Download Citation

K.-P. Johnsen, C. G. Frase, H. Bosse, and D. Gnieser "SEM image modeling using the modular Monte Carlo model MCSEM", Proc. SPIE 7638, Metrology, Inspection, and Process Control for Microlithography XXIV, 76381O (1 April 2010); https://doi.org/10.1117/12.846543

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available