Fabrication and characterization of high frequency phased arrays for NDE imaging

Xiaoning Jiang; Kevin Snook; Ruibin Liu; Xuecang Geng; Wesley S. Hackenberger

doi:10.1117/12.847624

8 April 2010 Fabrication and characterization of high frequency phased arrays for NDE imaging

Xiaoning Jiang, Kevin Snook, Ruibin Liu, Xuecang Geng, Wesley S. Hackenberger

Proceedings Volume 7649, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010; 76490X (2010) https://doi.org/10.1117/12.847624
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2010, San Diego, California, United States

Abstract

PMN-PT single crystal 1-3 composite high frequency phased arrays with center frequency of 35 MHz were fabricated and characterized for silicon carbide (SiC) NDE imaging applications. The 35 MHz 64-element array was successfully prototyped using PMN-PT single crystal and PC-MUT technology. The broad bandwidth > 90% and high sensitivity (echo amplitude > 500 mV from the impulse response with 0 gain) was observed with reasonably high uniformity. These high frequency phased arrays are promising for ceramic NDE imaging.

Citation Download Citation

Xiaoning Jiang, Kevin Snook, Ruibin Liu, Xuecang Geng, and Wesley S. Hackenberger "Fabrication and characterization of high frequency phased arrays for NDE imaging", Proc. SPIE 7649, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010, 76490X (8 April 2010); https://doi.org/10.1117/12.847624

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