Mach-Zehnder interferometric system for measuring the refractive indices of uniaxial crystals

Sergio De Nicola; Pietro Ferraro; Andrea Finizio; Paolo De Natale; Simonetta Grilli; Giovanni Pierattini

doi:10.1117/12.498644

8 July 2003 Mach-Zehnder interferometric system for measuring the refractive indices of uniaxial crystals

Sergio De Nicola, Pietro Ferraro, Andrea Finizio, Paolo De Natale, Simonetta Grilli, Giovanni Pierattini

Proceedings Volume 5036, Photonics, Devices, and Systems II; (2003) https://doi.org/10.1117/12.498644
Event: Photonics, Devices, and Systems II, 2002, Prague, Czech Republic

Abstract

We report a new interferometric technique for measuring the ordinary and extraordinary refractive indices of uniaxial crystals. The technique is based on the measurement of the rotation-dependent phase changes of the optical path length in crystal plates. Accurate measurement of the phase shift as a function of the rotation of the sample is achieved by using a fast-Fourier-transform based fringe analysis method for phase retrieval. The principle of the method is discussed and measurements of the ordinary and extraordinary refractive indices of a lithium niobate crystal are reported.

Citation Download Citation

Sergio De Nicola, Pietro Ferraro, Andrea Finizio, Paolo De Natale, Simonetta Grilli, and Giovanni Pierattini "Mach-Zehnder interferometric system for measuring the refractive indices of uniaxial crystals", Proc. SPIE 5036, Photonics, Devices, and Systems II, (8 July 2003); https://doi.org/10.1117/12.498644

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