Paper
11 October 2010 Measurement of refractive indices and optical axis of a uniaxial crystal assisted by Brewster angle and reflectivity fitting techniques
J. H. Xing
Author Affiliations +
Abstract
The refractive indices along arbitrary wave vector are analyzed in a uniaxial crystal with buried optical axis. According to the Brewster angle law, the relations between the Brewster angles of the incident p-polarized light and the two principal refractive indices are obtained for the case that the optical axis is in the incident plane. Further, for the case of unknown optical axis, the two principal refractive indices and the direction of optical axis can be calculated by inserting the experimental Brewster angles into the specially derived equations. On the other hand, the functions for the reflectivity fitting corresponding to two cases, i.e. , s-polarized light and p-polarized light, are presented. Finally, the CaCO3 crystal has been measured both in s-polarized light and p-polarized light with a view to carefully study the effect of incident angle on reflectivity. The accuracy of our measurement is able to reach 0.0001 without the need of any machining process on the sample.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. H. Xing "Measurement of refractive indices and optical axis of a uniaxial crystal assisted by Brewster angle and reflectivity fitting techniques", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76561P (11 October 2010); https://doi.org/10.1117/12.864200
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KEYWORDS
Crystals

Refractive index

Reflectivity

Crystal optics

Photodetectors

Crystallography

Optical testing

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