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Proceedings Article

Research on application of special filter in projecting grating profilometry

[+] Author Affiliations
Jianqiang Xu

Shandong Univ. of Technology (China) and Dalian Univ. of Technology (China)

Yunshan Wang, Shuchun Si, Chengyong Gao

Shandong Univ. of Technology (China)

Dazhen Yun

Dalian Univ. of Technology (China)

Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, 532 (April 28, 2003); doi:10.1117/12.510276
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From Conference Volume 5058

  • Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
  • Gong Xin Shen; Soyoung S. Cha; Fu-Pen Chiang; Carolyn R. Mercer
  • Beijing, China | September 03, 2002

abstract

In 3D projecting grating profilometry, we are often persecuted by some disgusted phenomenon of images, such as reflecting flare, overlapping of grating and other noise. All these can bring a bigger error in image processing. The intention of this paper is to propose some special filter and other methods of image processing. The technique we applied is based on peculiarity of projecting grating profilometry image, which has obvious directionality. We used the nonsymmetrical multi band-pass filters to reject the high frequency noise along the grating and other component except base frequency part. The result obtained from the processed image by multi band-pass filter is much better than that from primary image. The method is propitious to measure some smooth surfaces.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Jianqiang Xu ; Yunshan Wang ; Shuchun Si ; Chengyong Gao and Dazhen Yun
"Research on application of special filter in projecting grating profilometry", Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, 532 (April 28, 2003); doi:10.1117/12.510276; http://dx.doi.org/10.1117/12.510276


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