Paper
17 June 2003 Using a test shift for determination of direction of displacing an object
Sergey N. Malov
Author Affiliations +
Proceedings Volume 5129, Fundamental Problems of Optoelectronics and Microelectronics; (2003) https://doi.org/10.1117/12.502122
Event: Fundamental Problems of Optoelectronics and Microelectronics, 2002, Vladivostok, Russian Federation
Abstract
Determined methods for the measure of shift of object as a whole by means of holographic interferometry briefly discussed. Attempt is made to perfect these methods to enter a shift of test of object under investigation (or a collimating lens of the reference beam) at a time lag between opening along the optical axis. This procedure allows this to define a direction (sign) shift of explored object in own plane. Detailed theoretical analysis of writing double-undefended holograms Fourier with the multifunction shift of phase is given.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey N. Malov "Using a test shift for determination of direction of displacing an object", Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); https://doi.org/10.1117/12.502122
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KEYWORDS
Holograms

Holographic interferometry

Holography

Interferometry

Fourier transforms

Phase shifts

Transparency

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