Z-scan technique through beam dimension measurements

G. Tsigaridas; M. Fakis; I. Polyzos; Peter Persephonis; V. Giannetas

doi:10.1117/12.513490

9 April 2003 Z-scan technique through beam dimensions measurements

G. Tsigaridas, M. Fakis, I. Polyzos, Peter Persephonis, V. Giannetas

Proceedings Volume 5131, Third GR-I International Conference on New Laser Technologies and Applications; (2003) https://doi.org/10.1117/12.513490
Event: Third GR-I International Conference on New Laser Technologies and Applications, 2003, San Diego, CA, United States

Abstract

In the present work a modification of the well-known z-scan technique is presented. It is based on the direct measurement of the beam dimensions in the far field rather than the transmittance of the irradiance through an aperture. More specifically, the quantity measured in the case of a circular Gaussian incident beam is the beam radius in the far field, while in the more general case of an elliptic Gaussian beam the measured quantities are the lengths of the principal semiaxes of the beam. It is worth emphasizing that the latter case is more interesting in practice since even a very small misalignment of the resonator of an actual laser system can easily induce astigmatism to the beam. The measurements were performed through a CCD camera in connection with a laser beam profiler. The advantages of the proposed modification compared to the classic z-scan technique are the elimination of the sensitivity in beam pointing instability as well as the drastic reduction of the sensitivity in energy fluctuations. Furthermore, the application of the standard z-scan technique in the case of an elliptic Gaussian incident beam is extremely difficult. The technique has been tested using the standard nonlinear optical material CS₂ as a sample.

Citation Download Citation

G. Tsigaridas, M. Fakis, I. Polyzos, Peter Persephonis, and V. Giannetas "Z-scan technique through beam dimensions measurements", Proc. SPIE 5131, Third GR-I International Conference on New Laser Technologies and Applications, (9 April 2003); https://doi.org/10.1117/12.513490

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Optical testing

Transmittance

Laser systems engineering

Nonlinear optics

Refractive index

Beam analyzers

Gaussian beams

Show All Keywords

Keywords/Phrases

Search In:

Publication Years