Paper
12 December 2003 Compact methods for measuring stress birefringence
Nathan A. Hagen, Derek S. Sabatke, James F. Scholl, Peter A. Jansson, Weinong Wayne Chen, Eustace L. Dereniak, David T. Sass
Author Affiliations +
Abstract
The recent development of channelled spectropolarimetry presents opportunities for spectropolarimetric measurements of dynamic phenomena in a very compact instrument. We present measurements of stress-induced birefringence in an ordinary plastic by both a reference rotating-compensator fixed-analyzer polarimeter and a channelled spectropolarimeter. The agreement between the two instruments shows the promise of the channelled technique and provides a proof-of-principle that the method can be used for a very simple conversion of imaging spectrometers into imaging spectropolarimeters.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nathan A. Hagen, Derek S. Sabatke, James F. Scholl, Peter A. Jansson, Weinong Wayne Chen, Eustace L. Dereniak, and David T. Sass "Compact methods for measuring stress birefringence", Proc. SPIE 5158, Polarization Science and Remote Sensing, (12 December 2003); https://doi.org/10.1117/12.509424
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Birefringence

Polarization

Wave plates

Photoelasticity

Polarimetry

Spectrometers

Sensors

RELATED CONTENT


Back to Top