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Proceedings Article

Compact methods for measuring stress birefringence

[+] Author Affiliations
Nathan A. Hagen, James F. Scholl, Peter A. Jansson, Eustace L. Dereniak

Optical Sciences Ctr./Univ. of Arizona (USA)

Derek S. Sabatke

Ball Aerospace and Technologies Corp. (USA)

Weinong W. Chen

Univ. of Arizona (USA)

David T. Sass

U.S. Army Tank-automotive and Armaments Command (USA)

Proc. SPIE 5158, Polarization Science and Remote Sensing, 45 (December 9, 2003); doi:10.1117/12.509424
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From Conference Volume 5158

  • Polarization Science and Remote Sensing
  • Joseph A. Shaw; J. Scott Tyo
  • San Diego, California, USA | August 03, 2003

abstract

The recent development of channelled spectropolarimetry presents opportunities for spectropolarimetric measurements of dynamic phenomena in a very compact instrument. We present measurements of stress-induced birefringence in an ordinary plastic by both a reference rotating-compensator fixed-analyzer polarimeter and a channelled spectropolarimeter. The agreement between the two instruments shows the promise of the channelled technique and provides a proof-of-principle that the method can be used for a very simple conversion of imaging spectrometers into imaging spectropolarimeters.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Nathan A. Hagen ; Derek S. Sabatke ; James F. Scholl ; Peter A. Jansson ; Weinong W. Chen, et al.
"Compact methods for measuring stress birefringence", Proc. SPIE 5158, Polarization Science and Remote Sensing, 45 (December 9, 2003); doi:10.1117/12.509424; http://dx.doi.org/10.1117/12.509424


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