Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Correlated photon metrology of detectors and sources

[+] Author Affiliations
Jessica Y. Cheung, John R. Mountford, Christopher J. Chunnilall

National Physical Lab. (United Kingdom)

Martin P. Vaughan

Univ. of Essex (United Kingdom) and National Physical Lab. (United Kingdom)

Proc. SPIE 5161, Quantum Communications and Quantum Imaging, 365 (February 3, 2004); doi:10.1117/12.511956
Text Size: A A A
From Conference Volume 5161

  • Quantum Communications and Quantum Imaging
  • Ronald E. Meyers; Yanhua Shih
  • San Diego, California, USA | August 03, 2003


Many of the schemes under study for Quantum Information Processing technology based on photon states involve active and passive optical components as well as detectors. In order to able to establish fidelity levels for these schemes, the performance of the optical components and the quantum efficiency (q.e.) of the detectors require careful and accurate characterization. Correlated photons produced from spontaneous parametric downconversion, which are also the basis of entangled photon states, conveniently offer a direct means of measuring detector q.e. in the photon counting regime, while stimulated parametric downconversion can be used to measure source radiance. Detector and source calibration using correlated photon techniques therefore address some of the key issues critical to the development of QIP technology and the development of correlated/entangled photon metrology. This paper reports work being undertaken at NPL to establish the accuracy limitations of these correlated photon techniques. Significant sources of uncertainty are the need to measure losses due to any optical components used and the requirement to obtain and maintain good geometrical and spectral alignment.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Jessica Y. Cheung ; Martin P. Vaughan ; John R. Mountford and Christopher J. Chunnilall
"Correlated photon metrology of detectors and sources", Proc. SPIE 5161, Quantum Communications and Quantum Imaging, 365 (February 3, 2004); doi:10.1117/12.511956; http://dx.doi.org/10.1117/12.511956

Access This Article
Sign In to Access Full Content
Please Wait... Processing your request... Please Wait.
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).



Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections


Buy this article ($18 for members, $25 for non-members).
Sign In