Paper
29 January 2004 EUV multilayers for solar physics
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Abstract
We present an overview of currently available EUV multilayer coatings that can be used for the construction of solar physics instrumentation utilizing normal-incidence optics. We describe the performance of a variety of Si-based multilayers, including Si/B4C and new Si/SiC films that provide improved performance in the wavelength range from 25 n 35 nm, as well as traditional Si/Mo multilayers, including broad-band coatings recently developed for the Solar-B/EIS instrument. We also outline prospects for operation at both longer and shorter EUV wavelengths, and also the potential of ultra-short-period multilayers that work near normal incidence in the soft X-ray region.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David L. Windt, S. Donguy, John F. Seely, Benjawan Kjornrattanawanich, Eric M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca "EUV multilayers for solar physics", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); https://doi.org/10.1117/12.506175
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Cited by 49 scholarly publications.
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KEYWORDS
Multilayers

Reflectivity

Extreme ultraviolet

Iron

X-rays

Silicon

Absorption

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