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Proceedings Article

EUV multilayers for solar physics

[+] Author Affiliations
David L. Windt, S. Donguy

Columbia Univ. (USA)

John F. Seely

Naval Research Lab. (USA)

Benjawan Kjornrattanawanich

Universities Space Research Association (USA)

Eric M. Gullikson

Lawrence Berkeley National Lab. (USA)

C. C. Walton

Lawrence Livermore National Lab. (USA)

L. Golub, E. DeLuca

Smithsonian Astrophysical Observatory (USA)

Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, 1 (January 29, 2004); doi:10.1117/12.506175
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From Conference Volume 5168

  • Optics for EUV, X-Ray, and Gamma-Ray Astronomy
  • Oberto Citterio; Stephen L. O'Dell
  • San Diego, California, USA | August 03, 2003

abstract

We present an overview of currently available EUV multilayer coatings that can be used for the construction of solar physics instrumentation utilizing normal-incidence optics. We describe the performance of a variety of Si-based multilayers, including Si/B4C and new Si/SiC films that provide improved performance in the wavelength range from 25 n 35 nm, as well as traditional Si/Mo multilayers, including broad-band coatings recently developed for the Solar-B/EIS instrument. We also outline prospects for operation at both longer and shorter EUV wavelengths, and also the potential of ultra-short-period multilayers that work near normal incidence in the soft X-ray region.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

David L. Windt ; S. Donguy ; John F. Seely ; Benjawan Kjornrattanawanich ; Eric M. Gullikson, et al.
"EUV multilayers for solar physics", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, 1 (January 29, 2004); doi:10.1117/12.506175; http://dx.doi.org/10.1117/12.506175


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