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Proceedings Article

X-ray study of W/Si multilayers for the HEFT hard x-ray telescope

[+] Author Affiliations
Kristin K. Madsen, Finn E. Christensen, Carsten P. Jensen

Danish Space Research Institute (Denmark)

Eric Ziegler

European Synchrotron Radiation Facility (France)

William W. Craig, Kurt S. Gunderson

Lawrence Livermore National Lab. (USA)

Jason E. Koglin

Columbia Univ. (USA)

K. Pedersen

Astronomical Observatory/Univ. of Copenhagen (Denmark)

Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, 41 (January 29, 2004); doi:10.1117/12.505665
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From Conference Volume 5168

  • Optics for EUV, X-Ray, and Gamma-Ray Astronomy
  • Oberto Citterio; Stephen L. O'Dell
  • San Diego, California, USA | August 03, 2003

abstract

This paper outlines an in-depth study of the W/Si coated mirrors for the High Energy Focusing Telescope (HEFT). We present data taken at 8, 40 and 60 keV obtained at the Danish Space Research Institute and the European Synchrotron Radiation Facility in Grenoble. The set of samples were chosen to cover the parameter space of sample type, sample size and coating type. The investigation includes a study of the interfacial roughness across the sample surface, as substrates and later as coated, and an analysis of the roughness correlation in the W/Si coatings for N = 10 deposited bilayers. The powerlaw graded flight coating for the HEFT mirrors is studied for uniformity and scatter, as well as its performance at high energies.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Kristin K. Madsen ; Finn E. Christensen ; Carsten P. Jensen ; Eric Ziegler ; William W. Craig, et al.
"X-ray study of W/Si multilayers for the HEFT hard x-ray telescope", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, 41 (January 29, 2004); doi:10.1117/12.505665; http://dx.doi.org/10.1117/12.505665


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