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Proceedings Article

Characterization of polarization aberrations in liquid crystal devices

[+] Author Affiliations
Justin Wolfe, Russell Chipman

Optical Sciences Ctr./Univ. of Arizona (USA)

Proc. SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, 1 (November 7, 2003); doi:10.1117/12.505871
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From Conference Volume 5188

  • Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
  • Angela Duparre; Bhanwar Singh
  • San Diego, California, USA | August 03, 2003

abstract

Reflective Liquid Crystal on Silicon (LCoS) panels are widely used as light valves for projection displays. LCoS panels and the associated beam splitters, retardance films, and dichroic beam splitters display significant variations in polarization properties over the area, angle of incidence and spectral bandwidth of the projector. This paper surveys these polarization aberrations and describes a high speed Mueller Matrix Imaging Polarimeter (MMIP) for the characterization of these polarization aberrations. The characterization of projection systems and components by the MMIP enables advanced modeling and compensation of polarization aberrations.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Justin Wolfe and Russell Chipman
"Characterization of polarization aberrations in liquid crystal devices", Proc. SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, 1 (November 7, 2003); doi:10.1117/12.505871; http://dx.doi.org/10.1117/12.505871


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