Process monitor in thermal denaturation of albumin using dynamic speckle method based on wavelet entropy

Xinzhong Li; Qingdong Chen; Huihui Liu; Liben Li

doi:10.1117/12.835999

24 November 2009 Process monitor in thermal denaturation of albumin using dynamic speckle method based on wavelet entropy

Xinzhong Li, Qingdong Chen, Huihui Liu, Liben Li

Author Affiliations +

Proceedings Volume 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology; 75130J (2009) https://doi.org/10.1117/12.835999
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

The process of thermal denaturation of the albumin was investigated using dynamic speckle method based on wavelet entropy and analyzed by light scattering theory. In experiments, the dynamic speckle patterns sequences generated by albumin colloid during denaturing were acquired using a CCD camera. By analyzing the variations of wavelet entropy values of the THSPs (the time history of speckle patterns), the thermal denaturation process of albumin could be divided into two stages. At former heating process, the values of wavelet entropy were bigger; correspondingly, the protein particles were aggregated and flocculated quickly. Conversely, at latter heating process, the wavelet entropy values decreased drastically, which meant there was slow aggregation. According to those, the movement properties of the protein molecule ensemble were analyzed during thermal denaturation of the albumin. The results show that this method is effective to analyze the process of movement and aggregation of protein molecules quantitatively. The experiment proved that this method is an useful tool to investigate the particles motion in solution.

Citation Download Citation

Xinzhong Li, Qingdong Chen, Huihui Liu, and Liben Li "Process monitor in thermal denaturation of albumin using dynamic speckle method based on wavelet entropy", Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130J (24 November 2009); https://doi.org/10.1117/12.835999

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