Optical image hiding based on interference

Yan Zhang; Bo Wang

doi:10.1117/12.837003

24 November 2009 Optical image hiding based on interference

Yan Zhang, Bo Wang

Proceedings Volume 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology; 75130Q (2009) https://doi.org/10.1117/12.837003
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

Optical image processing has been paid a lot of attentions recently due to its large capacitance and fast speed. Many image encryption and hiding technologies have been proposed based on the optical technology. In conventional image encryption methods, the random phase masks are usually used as encryption keys to encode the images into random white noise distribution. However, this kind of methods requires interference technology such as holography to record complex amplitude. Furthermore, it is vulnerable to attack techniques. The image hiding methods employ the phase retrieve algorithm to encode the images into two or more phase masks. The hiding process is carried out within a computer and the images are reconstructed optically. But the iterative algorithms need a lot of time to hide the image into the masks. All methods mentioned above are based on the optical diffraction of the phase masks. In this presentation, we will propose a new optical image hiding method based on interference. The coherence lights pass through two phase masks and are combined by a beam splitter. Two beams interfere with each other and the desired image appears at the pre-designed plane. Two phase distribution masks are designed analytically; therefore, the hiding speed can be obviously improved. Simulation results are carried out to demonstrate the validity of the new proposed methods.

Citation Download Citation

Yan Zhang and Bo Wang "Optical image hiding based on interference", Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130Q (24 November 2009); https://doi.org/10.1117/12.837003

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